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SN74ABTH182646APM

SN74ABTH182646APM
Mfr. #:
SN74ABTH182646APM
説明:
Specialty Function Logic Device w/18-Bit Trnscvr & Register
ライフサイクル:
メーカー新製品
データシート:
SN74ABTH182646APM データシート
配達:
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ECAD Model:
詳しくは:
SN74ABTH182646APM 詳しくは SN74ABTH182646APM Product Details
製品属性
属性値
メーカー：
テキサスインスツルメンツ
製品カテゴリ：
特殊機能ロジック
JBoss：
Y
シリーズ：
SN74ABTH182646A
動作供給電圧：
5 V
最低動作温度：
- 40 C
最高作動温度：
+ 85 C
パッケージ/ケース：
LQFP-64
包装：
トレイ
関数：
バストランシーバー/レジスターを備えたスキャンテストデバイス
回路数：
2
動作温度範囲：
- 40 C to + 85 C
ブランド：
テキサスインスツルメンツ
取り付けスタイル：
SMD / SMT
感湿性：
はい
製品タイプ：
特殊機能ロジック
伝播遅延時間：
7 ns
ファクトリーパックの数量：
160
サブカテゴリ：
ロジックIC
商標名：
範囲
単位重量：
0.012088 oz
Tags
SN74ABTH1826, SN74ABTH182, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    A***k
    A***k
    PL

    all ok.

    2019-04-20
    D***v
    D***v
    RU

    Cool thing for this money

    2019-02-05
    A***v
    A***v
    US

    Order received in excellent condition, packed well. Corresponds to the description. Thank you very much to the seller! Five stars. I recommend. Order received in excellent condition, packed well. Fits the description. Thank you very much to the seller! Five stars. Recommend.

    2019-05-14
***as Instruments
Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
***ical
Scan Test Device -40C to 85C 64-Pin LQFP Tray
***et
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
***INS
The 'ABTH18646A and 'ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSRUMENTS
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers and registers.
***as Instruments Inc.
Transceiver function is controlled by output-enable () and direction (DIR) inputs. When is low, the transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR is low. When is high, both the A and B outputs are in the high-impedance state, effectively isolating both buses.
***AS INSTUMENTS
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that are performed with the 'ABTH18646A and 'ABTH182646A.
***AS INSTRU
 
***
In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***AS INSTR
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
***AS INST
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
***AS INSTRU
The B-port outputs of 'ABTH182646A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***XS
The SN54ABTH18646A and SN54ABTH182646A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18646A and SN74ABTH182646A are characterized for operation from -40°C to 85°C.
***ASI
 
***TEXAS
 
***as Instr.
The data-output functions can be enabled or disabled by various signals at and DIR. Data-input functions are always enabled; i.e., data at the bus pins is stored on every low-to-high transition of the clock inputs.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
モデル 説明 ストック 価格
SN74ABTH182646APM
DISTI # 29457866		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant		640
  • 500:$13.2348
  • 160:$14.3038
SN74ABTH182646APM
DISTI # 296-4133-ND		IC SCAN-TEST-DEV/TXRX 64-LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray		291In Stock
  • 640:$14.4293
  • 160:$15.8931
  • 25:$17.7752
  • 10:$18.6120
  • 1:$20.1800
SN74ABTH182646APM
DISTI # SN74ABTH182646APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH182646APM)
RoHS: Compliant
Min Qty: 1
Container: Tray		Americas - 0
  • 1:$19.4900
  • 10:$17.9900
  • 25:$17.1900
  • 50:$17.1900
  • 100:$15.5900
  • 500:$14.2900
  • 1000:$13.8900
SN74ABTH182646APM
DISTI # SN74ABTH182646APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray (Alt: SN74ABTH182646APM)
RoHS: Compliant
Min Qty: 1
Container: Tray		Europe - 0
  • 1:€16.5900
  • 10:€15.6900
  • 25:€14.9900
  • 50:€14.2900
  • 100:€13.5900
  • 500:€13.0900
  • 1000:€12.4900
SN74ABTH182646APMScan Test Devices With 18-Bit Transceivers And Registers3520
  • 1000:$11.8800
  • 750:$11.9200
  • 500:$13.2800
  • 250:$14.4300
  • 100:$15.1600
  • 25:$17.3600
  • 10:$17.9800
  • 1:$19.3400
SN74ABTH182646APMBoundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
RoHS: Compliant		2876
  • 1000:$13.7600
  • 500:$14.4900
  • 100:$15.0800
  • 25:$15.7300
  • 1:$16.9400
SN74ABTH182646APM
DISTI # 595-SN74ABTH182646AP		Specialty Function Logic Device w/18-Bit Trnscvr & Register
RoHS: Compliant		0
  • 160:$15.9000
  • 320:$15.1700
画像 モデル 説明
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Mfr.#: SN74ABTH16460DLG4

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Mfr.#: SN74ABTH245PWRE4

OMO.#: OMO-SN74ABTH245PWRE4-TEXAS-INSTRUMENTS

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SN74ABTH16244DGGR

Mfr.#: SN74ABTH16244DGGR

OMO.#: OMO-SN74ABTH16244DGGR-TEXAS-INSTRUMENTS

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SN74ABTH16260DLR

Mfr.#: SN74ABTH16260DLR

OMO.#: OMO-SN74ABTH16260DLR-TEXAS-INSTRUMENTS

 Latches D Type
可用性
ストック:
Available
注文中:
3000
数量を入力してください:
SN74ABTH182646APMの現在の価格は参考用です。最高の価格をご希望の場合は、お問い合わせまたは直接メールで営業チーム[email protected]までご連絡ください。
参考価格（USD）
量
単価
小計金額
160
$15.90
$2 544.00
320
$15.17
$4 854.40
640
$14.43
$9 235.20
2021年から半導体が不足しているため、2021年以前の通常価格以下の価格です。お問い合わせください。
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