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SN74LVTH182652APM

SN74LVTH182652APM
Mfr. #:
SN74LVTH182652APM
説明:
Specialty Function Logic 10-Bit Bus Interface F-F W/3-State Otpt
ライフサイクル:
メーカー新製品
データシート:
SN74LVTH182652APM データシート
配達:
DHL FedEx Ups TNT EMS
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ECAD Model:
詳しくは:
SN74LVTH182652APM 詳しくは SN74LVTH182652APM Product Details
製品属性
属性値
メーカー：
テキサスインスツルメンツ
製品カテゴリ：
特殊機能ロジック
JBoss：
Y
シリーズ：
SN74LVTH182652A
動作供給電圧：
2.7 V to 3.6 V
最低動作温度：
- 40 C
最高作動温度：
+ 85 C
パッケージ/ケース：
LQFP-64
包装：
トレイ
関数：
バストランシーバー/レジスターを備えたスキャンテストデバイス
回路数：
2
動作温度範囲：
- 40 C to + 85 C
ブランド：
テキサスインスツルメンツ
取り付けスタイル：
SMD / SMT
感湿性：
はい
製品タイプ：
特殊機能ロジック
伝播遅延時間：
8.2 ns
ファクトリーパックの数量：
160
サブカテゴリ：
ロジックIC
商標名：
範囲
単位重量：
0.012088 oz
Tags
SN74LVTH182, SN74LVTH18, SN74LVTH1, SN74LVTH, SN74LVT, SN74LV, SN74L, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    N***h
    N***h
    RU

    39 days

    2019-05-28
    M***a
    M***a
    LK

    Products seem to be of good quality as described,  shipment and delivery commendable, This product is highly recommended. "The duration for delivery was approximately 26 days"

    2019-05-29
    W***s
    W***s
    LB

    order not received

    2019-06-28
*** Stop Electro
Boundary Scan Reg Bus Transceiver, LVT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:LVT; Supply Voltage Min:2.7V; Supply Voltage Max:3.6V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL/CMOS; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
***XS
The 'LVTH18652A and 'LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INST
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
***AS INST
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers and registers.
***XS
Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and OEBA\) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state.
***AS INSTRUM
Control for B-to-A data flow is similar to that for A-to-B data flow but uses CLKBA, SBA, and OEBA\ inputs. Since the OEBA\ input is active-low, the A outputs are active when OEBA\ is low and are in the high-impedance state when OEBA\ is high. Figure 1 illustrates the four fundamental bus-management functions that can be performed with the 'LVTH18652A and 'LVTH182652A.
***AS INSTRU
In the test mode, the normal operation of the SCOPE bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
***as Instruments (TI)
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS USD
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
***AS INSTRUMENTS INCORPORATED
The B-port outputs of 'LVTH182652A, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
***AS USD
The SN54LVTH18652A and SN54LVTH182652A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVTH18652A and SN74LVTH182652A are characterized for operation from -40°C to 85°C.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
モデル 説明 ストック 価格
SN74LVTH182652APM
DISTI # 296-14323-ND		IC SCAN TEST DEVICE ABT 64-LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray		299In Stock
  • 640:$12.3090
  • 160:$13.8371
  • 25:$15.7048
  • 10:$16.3840
  • 1:$17.8300
SN74LVTH182652APM
DISTI # 26885593		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant		320
  • 160:$15.3700
SN74LVTH182652APM
DISTI # SN74LVTH182652APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74LVTH182652APM)
RoHS: Compliant
Min Qty: 160
Container: Tray		Americas - 0
  • 160:$14.0900
  • 320:$13.7900
  • 640:$13.1900
  • 960:$12.8900
  • 1600:$12.6900
SN74LVTH182652APM3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers3520
  • 1000:$9.6500
  • 750:$9.6800
  • 500:$10.7800
  • 250:$11.7200
  • 100:$12.3100
  • 25:$14.0900
  • 10:$14.6000
  • 1:$15.7100
SN74LVTH182652APM
DISTI # 595-SN74LVTH182652AP		Specialty Function Logic 10-Bit Bus Interface F-F W/3-State Otpt
RoHS: Compliant		0
  • 160:$13.8400
  • 320:$13.1600
  • 640:$12.3100
SN74LVTH182652APMBoundary Scan Reg Bus Transceiver, LVT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
RoHS: Compliant		1242
  • 1000:$11.1700
  • 500:$11.7600
  • 100:$12.2400
  • 25:$12.7700
  • 1:$13.7500
画像 モデル 説明
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Mfr.#: SN74LVTH16240DLG4

OMO.#: OMO-SN74LVTH16240DLG4-TEXAS-INSTRUMENTS

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Mfr.#: SN74LVTH16374DLG4

OMO.#: OMO-SN74LVTH16374DLG4-TEXAS-INSTRUMENTS

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Mfr.#: SN74LVTH574PWE4

OMO.#: OMO-SN74LVTH574PWE4-TEXAS-INSTRUMENTS

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SN74LVTH541DW

Mfr.#: SN74LVTH541DW

OMO.#: OMO-SN74LVTH541DW-TEXAS-INSTRUMENTS

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SN74LVTH2245PWR

Mfr.#: SN74LVTH2245PWR

OMO.#: OMO-SN74LVTH2245PWR-TEXAS-INSTRUMENTS

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Mfr.#: SN74LVTH543NSR

OMO.#: OMO-SN74LVTH543NSR-TEXAS-INSTRUMENTS

 IC TRANSCVR NON-INVERT 3.6V 24SO
可用性
ストック:
Available
注文中:
4500
数量を入力してください:
SN74LVTH182652APMの現在の価格は参考用です。最高の価格をご希望の場合は、お問い合わせまたは直接メールで営業チーム[email protected]までご連絡ください。
参考価格（USD）
量
単価
小計金額
160
$13.84
$2 214.40
320
$13.16
$4 211.20
640
$12.31
$7 878.40
2021年から半導体が不足しているため、2021年以前の通常価格以下の価格です。お問い合わせください。
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