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8V182512IDGGREP

8V182512IDGGREP
Mfr. #:
8V182512IDGGREP
説明:
Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
ライフサイクル:
メーカー新製品
データシート:
8V182512IDGGREP データシート
配達:
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ECAD Model:
詳しくは:
8V182512IDGGREP 詳しくは 8V182512IDGGREP Product Details
製品属性
属性値
メーカー：
テキサスインスツルメンツ
製品カテゴリ：
特殊機能ロジック
JBoss：
Y
シリーズ：
SN74LVTH182512-EP
動作供給電圧：
3.3 V
最低動作温度：
- 40 C
最高作動温度：
+ 85 C
パッケージ/ケース：
TSSOP-64
包装：
リール
関数：
ユニバーサルバストランシーバーを備えたスキャンテストデバイス
回路数：
2
動作温度範囲：
- 40 C to + 85 C
ブランド：
テキサスインスツルメンツ
取り付けスタイル：
SMD / SMT
製品タイプ：
特殊機能ロジック
伝播遅延時間：
7.7 ns
ファクトリーパックの数量：
2000
サブカテゴリ：
ロジックIC
パーツ番号エイリアス：
V62/04730-01XE
単位重量：
0.009263 oz
Tags
8V18, 8V1
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***as Instruments
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85
***et
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
***i-Key
IC ABT SCAN TEST DEV3.3V 64TSSOP
***AS INSRUMENTS
The SN74LVTH18512 and SN74LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSTRUMENTS INC
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
***ASIN
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE™ universal bus transceivers.
***AS INSTRUMENT
Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB\ is low, the B outputs are active. When OEAB\ is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA\, LEBA, and CLKBA inputs.
***AS INST
In the test mode, the normal operation of the SCOPE™ universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
***XS
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INSRUMENTS
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
***as Instruments (TI)
The B-port outputs of SN74LVTH182512, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
モデル 説明 ストック 価格
8V182512IDGGREP
DISTI # 296-22075-1-ND		IC ABT SCAN TEST DEV3.3V 64TSSOP
RoHS: Compliant
Min Qty: 1
Container: Cut Tape (CT)		1991In Stock
  • 500:$12.3961
  • 100:$13.9349
  • 10:$16.5000
  • 1:$17.9500
8V182512IDGGREP
DISTI # 296-22075-6-ND		IC ABT SCAN TEST DEV3.3V 64TSSOP
RoHS: Compliant
Min Qty: 1
Container: Digi-Reel®		1991In Stock
  • 500:$12.3961
  • 100:$13.9349
  • 10:$16.5000
  • 1:$17.9500
8V182512IDGGREP
DISTI # 296-22075-2-ND		IC ABT SCAN TEST DEV3.3V 64TSSOP
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)		Temporarily Out of Stock
  • 2000:$10.6240
8V182512IDGGREP
DISTI # 8V182512IDGGREP		Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R - Tape and Reel (Alt: 8V182512IDGGREP)
RoHS: Compliant
Min Qty: 2000
Container: Reel		Americas - 0
  • 2000:$11.9900
  • 4000:$11.3900
  • 8000:$10.9900
  • 12000:$10.6900
  • 20000:$10.3900
8V182512IDGGREPEnhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers4000
  • 1000:$9.4300
  • 750:$9.4600
  • 500:$10.5400
  • 250:$11.4500
  • 100:$12.0400
  • 25:$13.7800
  • 10:$14.2800
  • 1:$15.3600
8V182512IDGGREP
DISTI # 595-8V182512IDGGREP		Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
RoHS: Compliant		0
  • 2000:$11.0400
V62/04730-01XE
DISTI # 595-V62/04730-01XE		Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
RoHS: Compliant		0
    画像 モデル 説明
    8V182512IDGGREP

    Mfr.#: 8V182512IDGGREP

    OMO.#: OMO-8V182512IDGGREP

    		 Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
    8V182512IDGGREP

    Mfr.#: 8V182512IDGGREP

    OMO.#: OMO-8V182512IDGGREP-TEXAS-INSTRUMENTS

    		 Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
    可用性
    ストック:
    Available
    注文中:
    5000
    数量を入力してください:
    8V182512IDGGREPの現在の価格は参考用です。最高の価格をご希望の場合は、お問い合わせまたは直接メールで営業チーム[email protected]までご連絡ください。
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