By Broadcom Limited 93
Broadcom's AFBR-S4N44C013 is a single SiPM used for ultra-sensitive and fast measurement of single photons and pulsed light sources.
The active area is 3.72 mm x 3.72 mm. High packing density of the single chips is achieved using through-silicon-via (TSV) technology. Tiling multiple AFBR-S4N44C013 SiPMs can cover larger areas almost without any edge losses. The protective layer is made by a glass highly transparent down to UV wavelengths, resulting in a broad response in the visible light spectrum with high sensitivity toward the blue- and near-UV region of the light spectrum. This SiPM is well-suited for the detection of low-level pulsed light sources, especially Cherenkov or scintillation light from the very common organic plastic materials and inorganic scintillator materials including LSO, LYSO, BGO, Nal, Csl, BaF, and LaBr.
This product is used for ultra-sensitive precision measurement of single photons, features high PDE, and is four-side tileable. High packing density of the single chips is achieved using through-silicon via (TSV) technology. Tiling multiple AFBR-S4N44C013 arrays can cover larger areas with little to no edge losses.